MIT optical test system (wafer test)
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Characteristic:
High strength nylon or polyester fiber is used to provide functional protection for various special industries through professional design, as follows:
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Wafer optical test system, 8&12inch wafers of various materials;
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Automatic three axis motion control;
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Wafer loading and unloading, automatic alignment, automatic test;
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Multifunctional fixture, support 8&12 probe card;
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Multiple instruments support AOI and optics;
Project | Specifications |
size | Length*width*height: 2.84m*1.90m*2.40M |
Test sample size | 8”&12”wafer |
Spectrograph | CS-2000A/SR-UL2/PR788/SR3 |
Camera | 43million, high resolution CCD. |
Motor system | High precision servo motor and high precision ball screw are used |
Function | Chromaticity, brightness, uniformity, spectrum test support: point, line, surface defect test, mura test. |
Signal | It supports special instrument made models and market general brand signal machines, supports customized signal, and signal format: TTL / LVDS / Mipi / HDMI / EDP / 2K&4K&8K, etc |
Power Supply | Support high precision multi-channel DC power output, as well as customized power demand. |
Software | The software developed by Teyi is all Chinese version, C # programming modularization, easy to operate, UI interface can be customized according to customer needs, the software comes with various standard test methods, and can be tested through direct call mode. |
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